| ISBN: ISBN: 0-7803-9362-7
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| ISBN: DOI: 10.1109/FPL.2005.1515755
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| |
| description |
Benefits of Field Programmable Gate Arrays (FPGAs) have lead to a
spectrum of use ranging from consumer products to astronautics. This
diversity necessitates the need to evaluate the reliability of the
FPGA, because of their high susceptibility to soft errors, which are
due to the high density of embedded SRAM cells. Reliability
evaluation is an important step in designing highly reliable
systems, which results in a strong competitive advantage in
today's marketplace. This paper proposes a mathematical model
able to evaluate and therefore help to improve the reliability of
SRAM-based FPGAs.
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| publisher |
Institute of Electrical and Electronics Engineers,
Inc.
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| type |
Text
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| Article in Proceedings
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| source |
In: Proceedings of the 15th IEEE International Conference on Field
Programmable Logic and Applications (FPL), Tampere, Finland, August
24-26, 2005, pp. 403-408
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| contributor |
ITI, Rechnerarchitektur
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| subject |
Reliability, Testing, and Fault-Tolerance (CR B.8.1)
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